Interference microscope

Japanese: 干渉顕微鏡 - かんしょうけんびきょう
Interference microscope

A microscope that can observe transparent samples by using the interference of light. Transparent samples such as biological cells are very difficult to see with a normal microscope, and it is difficult to detect minute irregularities on the surface. There is also a method of staining the sample, but this can kill the cells. Such transparent samples are called phase objects because they affect only the phase of the transmitted or reflected light without changing its brightness. An interference microscope is a microscope that uses interference with a phase object and adds a device to convert phase changes into brightness changes. A microscope that superimposes the sample light that has passed through the sample and the reference light created by a Michelson interferometer or a Fresnel biprism and causes interference has been created. In addition, since the samples measured with a microscope are generally small, a method is also used in which a reference light is created by attaching a component for phase contrast observation to a normal microscope and using an optical path outside the field of view that passes around the sample, rather than preparing a separate reference light. This is called a phase contrast microscope, and it cleverly applies the theory of diffraction in microscopes to change only the phase of the zeroth order diffracted light, making it possible to observe phase objects.

[Kouzo Ishiguro and Takahiro Kuga]

[Reference] | Phase contrast microscope | Interference | Microscope | Michelson interferometer

Source: Shogakukan Encyclopedia Nipponica About Encyclopedia Nipponica Information | Legend

Japanese:

光の干渉を利用することにより、透明試料などが観察できる顕微鏡。通常の顕微鏡では生体細胞のような透明なものはたいへんに見にくく、表面の微細な凹凸の検出などは困難である。試料を染色する手法もあるが、細胞などが死滅するおそれもある。このような透明試料は透過光または反射光の明るさには変化を与えず位相にのみ影響を与えるため、位相物体とよばれる。位相物体に対して干渉を利用し、位相の変化を明るさの変化に変えるくふうを加えた顕微鏡が干渉顕微鏡である。試料を通過した試料光と、マイケルソン干渉計、フレネルの複プリズムなどによりつくりだした参照光とを重ね合わせて干渉させるものがつくられている。また顕微鏡で測定する試料は一般的に小さいので、改めて別の参照光を用意せずに、通常の顕微鏡に位相差観察用の部品を取り付け、試料の周辺を通過する視野外の光路を利用して参照光をつくる方法も利用されている。これは位相差顕微鏡とよばれ、顕微鏡の回折理論を巧みに応用し、ゼロ次の回折光の位相のみを変化させて位相物体を観察できるようにしたものである。

[石黒浩三・久我隆弘]

[参照項目] | 位相差顕微鏡 | 干渉 | 顕微鏡 | マイケルソン干渉計

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