Interferometer

Japanese: 干渉計 - かんしょうけい(英語表記)interferometer
Interferometer

A device that uses the interference that occurs when light waves overlap to measure length (distance), surface shape, refractive index, and to investigate the fine structure of spectral lines. Various types of devices have been devised, including the Michelson type, the Jamin type, the Fabry-Perot type, and the Rummer-Goehrke type.

When two monochromatic light waves overlap, a new light wave is created by wave interference, but the amplitude varies depending on the phase relationship between the two incident light waves. When light from a single light source is split into two optical paths and then rejoined after traveling a certain distance to create an interference wave, the difference in the length of the optical path that the two waves passed while they were separated creates an intensity of the interference wave. Therefore, by gradually changing the difference in the optical path, a pattern is obtained in which the intensity of the interference wave changes into a waveform. Also, when the optical path difference varies depending on the location where the interference wave is created, a spatial stripe pattern is observed. These are called interference fringes. When multiple waves with sequentially different optical path differences by a certain amount interfere with each other, the resulting interference fringes are made up of sharp, fine lines. The image of the spectral lines created by a diffraction grating is the result of interference between light waves diffracted by multiple slits (grooves), and so appears as fine lines.

[Ryuto Onaka]

"Optical Experiments and Measurement Methods I and II, by D. Malacara, translated by Kyoji Nariai, Junko Kiyohara, and Junpei Tsujiuchi (2010, Adcom Media)"

[Reference] | Interference | Jamin interferometer | Fabry-Perot interferometer | Michelson interferometer

Source: Shogakukan Encyclopedia Nipponica About Encyclopedia Nipponica Information | Legend

Japanese:

光の波動が重なったときにおこる干渉作用を利用して、長さ(距離)、表面形状や屈折率の測定、さらにスペクトル線の微細構造などを調べる装置。マイケルソン型、ジャマン型、ファブリ‐ペロ型、ルンマー‐ゲールケ型など種々の装置が考案されている。

 二つの単色の光波が重なったとき、波の干渉によって新しい光波がつくられるが、二つの入射光波の間の位相関係によって、振幅に強弱を生ずる。一つの光源からの光を二つの光路に分け、ある長さを進んだあとでふたたび合致させ、干渉波をつくると、分かれていた間に通過した光路の長さの差によって、干渉波に強弱ができる。したがって、光路の差を徐々に変えていくと、干渉波の強度が波形に変化した図形を得られる。また干渉波のつくられる場所に従って、光路差が異なっているときは、空間的な縞(しま)模様が観測される。これらを干渉縞という。光路差が一定量だけ順次に異なっている多数の波が干渉した場合には、結果として得られる干渉縞は鋭い細かい線からできている。回折格子によってつくられるスペクトル線の像は、多数のスリット(溝)によって回折された光波間の干渉の結果つくられるので、細かい線となって現れたものである。

[尾中龍猛]

『D・マラカラ著、成相恭二・清原順子・辻内順平訳『光学実験・測定法』Ⅰ、Ⅱ(2010・アドコム・メディア)』

[参照項目] | 干渉 | ジャマン干渉計 | ファブリ‐ペロ干渉計 | マイケルソン干渉計

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