...secondary electron yield is sensitive to the surface condition of a solid, so it is also used in scanning electron microscopes to see images (secondary electron images) that distinguish differences in the surface of a sample. *Some terminology that refers to "field emission" is listed below. Source | Heibonsha World Encyclopedia 2nd Edition | Information |
…二次電子収率は固体の表面状態に敏感に依存するので,走査形電子顕微鏡で,試料表面の差を識別した像(二次電子像)を見るのにも使われている。 ※「field emission」について言及している用語解説の一部を掲載しています。 出典|株式会社平凡社世界大百科事典 第2版について | 情報 |
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